ISROS Logo INTERNATIONAL SYMPOSIUM ON RELIABILITY OF OPTOELECTRONICS FOR SPACE (ISROS)
April 28-30, 2010
Cagliari, Sardinia (Italy)

//

Organised by http://www.isros.org






Welcome to ISROS 2010

    ROUND TABLE ISROS 2010
    OPTOELECTRONIC COMPONENTS IN HI-REL APPLICATIONS:
    CONSTRAINTS, ISSUES, RULES AND TEST METHODS.

    Last year, the special ISROS 2009 Round Table discussions focussed on the following questions :

    • In which application, optoelectronics based solutions may be used instead of other technologies?
      Application related to telecommunication or observation satellites, scientific missions, long term extra
      Earth/Moon or Solar missions will be considered.
    • What are the main OEDs of interest for these application ?
    • Why didn't the space application market used them in a deeper way yet?
    • What could be done at manufacturers, space industries, space agencies, end-users and operators
      level to push these technologies?


    On Tuesday May 12th 2009, the first round table on OptoElectronic Devices for Space was possible thanks
    to the major contribution of panel members A. Johnston (JPL), M. Zahir (ESA), L. Mondin (CNES), F. Svelto
    (ASI), J. Barbero (ALTER), L. Bechou (IMS Bordeaux), A. Coello Vera (Thales Alenia Space), S. Mariojouls
    (EADS-ASTRIUM), and the convenor A. Bensoussan (Thales Alenia Space.

    The 2nd edition Round Table is proposed now during ISROS 2010 and structured in a main discussion and
    interactive talk with the ISROS attendees on several selected topics. Each panel member will propose their
    experience and advice in the field selected during a 5 to 10 minutes informal presentation. Then questions
    will come from the audience and debated.
    The new ISROS 2010 Round Table will play for a 2-3 hours discussions. It will address the following topics
    thanks to the 8-10 panel members invited, Managers and Experts from the Agencies, Industries,
    Laboratories and Universities:

    1. Packaging concerns under space constraints

      Mechanical Optical
      Electronics and power Radiations
      Environmental stresses


    2. Rules and test methods

      Industry needs Manufacturer needs


    3. Failure mechanisms

      Classification (MIL, TELCORDIA, ESA, …) Thermal effects
      Radiation effects Vacuum effect on COD
      Package related defects: RGA, thermal management, optical windows and fibres
      Rapid depressurization


    4. Tests methods for evaluation, qualification and screening

      System models: design optimization, failure modes impacts, mission lifetime and prediction models
      Characterization test methods: Electrical   Optical   Mechanical
      Existing and missing test methods
      Reliability test methods:
      Arrhenius     Other models
      Vibration - fatigue    ESD
      Humidity
      Radiation