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Welcome to ISROS 2010
ROUND TABLE ISROS 2010
OPTOELECTRONIC COMPONENTS IN HI-REL APPLICATIONS:
CONSTRAINTS, ISSUES, RULES AND TEST METHODS.
Last year, the special ISROS 2009 Round Table discussions focussed on the following questions :
- In which application, optoelectronics based solutions may be used instead of other technologies?
Application related to telecommunication or observation satellites, scientific missions, long term extra
Earth/Moon or Solar missions will be considered.
- What are the main OEDs of interest for these application ?
- Why didn't the space application market used them in a deeper way yet?
- What could be done at manufacturers, space industries, space agencies, end-users and operators
level to push these technologies?
On Tuesday May 12th 2009, the first round table on OptoElectronic Devices for Space was possible thanks
to the major contribution of panel members A. Johnston (JPL), M. Zahir (ESA), L. Mondin (CNES), F. Svelto
(ASI), J. Barbero (ALTER), L. Bechou (IMS Bordeaux), A. Coello Vera (Thales Alenia Space), S. Mariojouls
(EADS-ASTRIUM), and the convenor A. Bensoussan (Thales Alenia Space.
The 2nd edition Round Table is proposed now during ISROS 2010 and structured in a main discussion and
interactive talk with the ISROS attendees on several selected topics. Each panel member will propose their
experience and advice in the field selected during a 5 to 10 minutes informal presentation. Then questions
will come from the audience and debated.
The new ISROS 2010 Round Table will play for a 2-3 hours discussions. It will address the following topics
thanks to the 8-10 panel members invited, Managers and Experts from the Agencies, Industries,
Laboratories and Universities:
- Packaging concerns under space constraints
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Optical |
| Electronics and power |
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Radiations |
| Environmental stresses |
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- Rules and test methods
| Industry needs |
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Manufacturer needs |
- Failure mechanisms
| Classification (MIL, TELCORDIA, ESA, …) |
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Thermal effects |
| Radiation effects |
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Vacuum effect on COD |
| Package related defects: RGA, thermal management, optical windows and fibres |
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| Rapid depressurization |
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- Tests methods for evaluation, qualification and screening
| System models: design optimization, failure modes impacts, mission lifetime and prediction models |
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| Characterization test methods: Electrical Optical Mechanical |
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| Existing and missing test methods |
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| Reliability test methods: |
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| Arrhenius Other models |
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| Vibration - fatigue ESD |
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| Humidity |
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| Radiation |
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