ISROS Logo INTERNATIONAL SYMPOSIUM ON RELIABILITY OF OPTOELECTRONICS FOR SPACE (ISROS)
April 28-30, 2010
Cagliari, Sardinia (Italy)
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Organised by http://www.isros.org





    ROUND TABLE ISROS 2010
    OPTOELECTRONIC COMPONENTS IN HI-REL APPLICATIONS:
    CONSTRAINTS, ISSUES, RULES AND TEST METHODS.

    The 2nd edition Round Table is proposed now during ISROS 2010 and will be structured in a two session discussion and interactive talk with the ISROS attendees on several selected topics. Each panel member will propose their experience and advice in the field selected during a 5 to 10 minutes informal presentation. Then questions will come from the audience and debated.

    The new ISROS 2010 Round Table is organized on two sets of 1 hour and half each.

    The invited panel members (Managers and Experts from the Agencies, Industries, Laboratories and Universities) will address questions and issues as listed hereunder

    Session A: Test methods for Optoelectronics in Space
    Chairman A. Bensoussan (Thales Alenia Space)

    Invited speaker Organisation Topic commented
    R. Stevens
    Technical Director Advanced Technology Group     		Lockheed Martin Eagan, MN (USA) Optoelectronics packaging for military and space applications.
    E. Armandillo
    Head of Optoelectronic Section    		 ESA (European Space Agency), Noordwijk, The Netherlands. Reliability of Optoelectronics components in Space environment: some considerations on issues from the Design to Qualification/Verification
    M. Comparini
    R&D and Product policy
    		 Thales Alenia Space L'Aquila-Roma, Italy. What are the breakthrough proposed by optoelectronic systems?
    M. Fukuda
    Professor    		 University of Technology Toyohashi (Japan) Fiber Optic communication systems : package concerns and issues.
    C. Aupetit Berthelemot
    Assistant Professor
    L. Bechou
    Assistant Professor     		Xlim/University of Limoges


    IMS/University of Bordeaux (France)     		Test methods for evaluation, qualification and screening: System models: design optimization, failure modes impacts, operating lifetime and prediction models.
    C. Tabbert
    VP Sales & Marketing, Chairman of JEDEC 13.6 committee on Fiber optics in harsh environments.     		Ultra Communications Inc. Vista, CA (USA) JEDEC/SAE 13.6 committee activities : to standardize the testing and qualification requirements for fiber optic components in space, avionic and missile environments
    J. Tomm
    Head of the "Optoelectronic device" group    		 Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy. Berlin (Germany) Catastrophic optical damage (COD) is a sudden degradation mechanism. The talk will present our current work to make the COD process measurable.

    Session B: Reliability issues on optoelectronics for space
    Chairman C. Tabbert (Ultra Communications, Inc.)

    Invited speaker Organisation Topic commented
    Y. Tange
    Deputy Director, Earth Obsevation Resarch Center (EORC)    		 JAXA (Japan Aerospace Exploration Agency) Deputy Director, Earth Observation Resarch Center (EORC) Packaging concerns and Space constraints : Mechanical, Optical, Electronics and power, Radiations.
    M.Ott
    Photonics Group Leader


    I. Gontijo
    Photonics Group (JPL)    		 NASA, Goddard Space Flight Center, Applied Engineering & Technology Directorate, Electrical Engineering Division. Greenbelt MD (USA)

    Jet Propulsion Laboratory California Institute of Technology. Pasadena, CA (USA).     		Optoelectronic fiber optic packaging lessons learned for space usage.
    A. Johnston
    Principal Engineer at the Jet Propulsion Laboratory
    		 Jet Propulsion Laboratory California Institute of Technology. Pasadena, CA (USA). Reliability and Radiation Effects in Compound Semiconductors.
    A.Paccagnella
    Professor, Head of Department of Information Engineering    		 University of Padova (Italy) Radiation effects on packaged devices : the package shielding effects when total ionizing dose effects are studied.
    G.Quadri
    Quality assurance engineer for optoelectronic parts
    		 CNES (Centre National d’Etudes Spatiales), Toulouse (France)
    		 Reliability figures estimation of optoelectronics for space mission
    ALL Open topic: Is it possible to involve the whole space community in some common action which could address the reliability of optoelectronics for space?